- GeoRef, Copyright 2008, American Geological Institute. Reference includes data from Bibliography and Index of North American Geology, U. S. Geological Survey, Reston, VA, United States
The paragenetic sequence of three authigenic minerals has been photographed in a fine-grained sandstone using the scanning electron microscope (SEM). The instrument used in these studies is the Stereoscan, manufactured by the Cambridge Instrument Company. The SEM is superior to the transmission electron microscope for revealing delicate authigenic minerals. The electron micrographs illustrate the value of the SEM in studying microfeatures of sedimentary rocks and point out the continuing need for supplementary mineralogical data.